Normal view MARC view ISBD view

ntegrated circuit defect-sensitivity : theory and computational models /

by de Gyvez, José Pineda
Additional authors: Dhiraj k. Pradhan
Edition statement:1st ed Published by : Meenakshi (Delhi) Physical details: 316 p 24 cm Year: 2000
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Item type Current location Call number Copy number Status Date due Barcode
Book Book Shah Alam, Malaysia
621.3815 G J I (Browse shelf) C1 Available 00016969

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