ntegrated circuit defect-sensitivity : theory and computational models /
by de Gyvez, José Pineda
Edition statement:1st ed Published by : Meenakshi (Delhi) Physical details: 316 p 24 cm Year: 2000Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Book | Shah Alam, Malaysia | 621.3815 G J I (Browse shelf) | C1 | Available | 00016969 |
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